Time-of-FlightSIMS

2022年5月18日—Time-of-FlightSecondaryIonMassSpectrometry(ToFSIMS)isasurfaceanalysistechniqueusedtostudythechemicalcompositionofsolid ...,,TheprincipleofToF-SIMSinvolvesdetectionofsecondaryionsejectedbytheprimaryionbombardment.Thismethodenablesprobingofthechemicalcomposition ...,TheToFanalyzerisverticallymounted.Theextractedionstravelupwardstoanionmirrorwheretheyarereflecteddownwardstothedetect...

參考資訊如下
ToF SIMS

2022年5月18日 — Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a surface analysis technique used to study the chemical composition of solid ...

Time-of-Flight Secondary Ion Mass Spectrometry (ToF

Time-of

The principle of ToF-SIMS involves detection of secondary ions ejected by the primary ion bombardment. This method enables probing of the chemical composition ...

TOF-SIMS (Time-of

The ToF analyzer is vertically mounted. The extracted ions travel upwards to an ion mirror where they are reflected downwards to the detection system. This ...

TOF

A time-of-flight analyzer is used to measure the exact mass of the emitted ions and clusters. From the exact mass and intensity of the SIMS peak, the identity ...

Time-of

TOF-SIMS is a technique that detects all the elements in the periodic table, including hydrogen. TOF-SIMS can provide mass spectral information; image ...

What is TOF

What is TOF-SIMS? Principle. Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a technique in which an ion beam (primary ion) is irradiated on a ...